You are currently viewing only those items made visible to the public. Sign in here with your UCL username and password to view the full catalogue.
|HSC2 (MT5000HC), HSC2 (H1002), Oxford CT1500
|No special training required.
|Enquire about this item
Allows dynamic tensile, compression and bending tests of specimens in the SEM (Scanning Electron Microscope)*. Allows dynamic observations of phase transitions and other microstructural changes with respect to temperature within the SEM (Scanning Electron Microscope)
Item ID #.
Last Updated: 19th March, 2013