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Focused Ion Beam (FIB) Microscope XB1540
| MANUFACTURER | Zeiss |
|---|---|
| MODEL | XB1540 |
| CONTACT 1 | Dr Suguo Huo |
|---|---|
| Enquire about this item | |
| SITE | Bloomsbury Campus |
Description
The instrument is equipped not only with an in situ field-emission scanning electron microscope for gallium-free imaging, but also an in situ low-voltage argon-ion-miller for gallium-free nanofabrication.
Item ID #.
Last Updated: 6th November, 2015
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