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Organisational Unit : UCL Qatar [x]
technique : Electron Microscopy and Microanalysis [x]

Scanning Electron Microscope with Energy Dispersive Spectrometer (EDS-SEM)

The JSM-6610LV low vacuum SEM is a high-performance scanning electron microscope. An innovative X-MacN 50mm Silicon Drift Detector is attached for EDS microanalysis, using the new AZtecEnergy software from Oxford Instruments.
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- Manufacturer: JEOL / Oxford Instruments