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| CONTACT 1 | Steve Hudziak |
|---|---|
| Enquire about this item | |
| SITE | Bloomsbury Campus |
The easy-to-use Model 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage
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Last Updated: 17th January, 2014
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