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Jeol JSM-6480LV high-performance, Variable Pressure Analytical Scanning Electron Microscope

MANUFACTURER Jeol
MODEL Jeol JSM - 6480LV
CONTACT 1 Jim Davy
CONTACT 2 Peter Sammonds
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SITE Bloomsbury Campus

Description

Variable Pressure Analytical Scanning Electron Microscope with a high resolution of 3.0nm

Item ID #1159.

Last Updated: 19th March, 2013

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