Enquire Now

Scanning Electron Microscope (SEM)

MANUFACTURER JEOL
MODEL 5410LV
RESTRICTIONS None
TRAINING Training is required to use this item and we can arrange this if needed.
CONTACT 1 Mark Turmaine
Enquire about this item
SITE Bloomsbury Campus

Description

Scanning Microscope can be used for observation of the entire Area of large sized specimens up to 5-inch in diameter by rotating them. The whole series of operation including vacuum evacuation, image observation, focusing, and photographing have been automated.

Item ID #599.

Last Updated: 17th January, 2014

Scanning Electron Microscope (SEM)

There are no publically available categories listed at present. You may have to sign in to browse this catalogue.