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Scanning Electron Microscope (SEM)
| MANUFACTURER | JEOL |
|---|---|
| MODEL | 5410LV |
| RESTRICTIONS | None |
|---|---|
| TRAINING | Training is required to use this item and we can arrange this if needed. |
| CONTACT 1 | Mark Turmaine |
|---|---|
| Enquire about this item | |
| SITE | Bloomsbury Campus |
Description
Scanning Microscope can be used for observation of the entire Area of large sized specimens up to 5-inch in diameter by rotating them. The whole series of operation including vacuum evacuation, image observation, focusing, and photographing have been automated.
Item ID #.
Last Updated: 17th January, 2014
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