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Scanning Electron Microscope (SEM) with EDS

MANUFACTURER Zeiss
MODEL Evo 10
CONTACT 1 Dr. Barry Reid
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SITE Bloomsbury Campus

Description

"SEM Type: Variable pressure SEM with tungsten filament (standard resolution) Magnification Range: 7x to 100,000x

SEM Applications: Routine materials characterization Industrial QA/failure analysis Particle and surface morphology studies Suitable for non-high-resolution imaging tasks

EDS features: Semi-quantitative elemental analysis from z=4 upwards. Elemental mapping capabilities."

Item ID #4166.

Last Updated: 24th February, 2026

Scanning Electron Microscope (SEM) with EDS

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