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Keithley 4200/Probe Station


Department of Electronic and Electrical Engineering

CONTACT 1 Steve Hudziak
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SITE Bloomsbury Campus


The easy-to-use Model 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage

Item ID #1393.

Last Updated: 17th January, 2014

Keithley 4200/Probe Station

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