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Four Point Probe

MODEL FFP 5000 Model

London Centre for Nanotechnology

TRAINING No special training required.
CONTACT 1 Steve Etienne
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SITE Bloomsbury Campus


This is the FFP5000 model of probe equipped with an external probe and sample holder.  The stage is capable of accepting wafers up to 100mm diameter and has indexed locations to permit reproducable positioning.


Automatic measurement of Ohms/square or V/I values. Thickness and resistivity of materials can be calculated after entering resistivity and thickness..

Minimum sample size is 25mm.

Item ID #2435.

Last Updated: 17th January, 2014

Four Point Probe

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