Enquire Now

Dimension 3100 AFM

MANUFACTURER Bruker
MODEL 3100 AFM
ACRONYM AFM

London Centre for Nanotechnology

AVAILABILITY 8am to 6pm. Evening and weekend use by experienced users only
RESTRICTIONS None
TRAINING Training is required to use this item and we can arrange this if needed.
CONTACT 1 Richard Thorogate
CONTACT 2 Bart Hoogenboom
Enquire about this item
SITE Bloomsbury Campus

Description

The Dimension 3100 utilises standard and advanced SPM imaging modes for measuring semiconductor wafers, lithography masks, magnetic media, biomaterials, optics and other materials. The sample stage  will allow large sample sizes (up to a 6 inch wafer) with a scan size up to 100 µm in the X & Y and 6 µm in the Z.

Specification

Contact mode Tapping mode Phase imaging Lateral force mode Force imaging MFM Electric techniques (CAFM, Tuna) Closed loop option

Item ID #2393.

Last Updated: 6th November, 2015

Dimension 3100 AFM

There are no publically available categories listed at present. You may have to sign in to browse this catalogue.