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PSIA XE-100 Atomic Force Microscope

MANUFACTURER Park Systems (PSIA)
MODEL XE-100

Eastman Dental Institute

CONTACT 1 Jonathan Knowles
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SITE Eastman Dental Institute

Description

The PSIA XE-100 is a non contact atomic force microscope. The separated and high force nature of the scanning piezos produces very high quality images without effects of tip or sample deterioration. The full enclosure and active anti-vibration table which support the instrument provide an optimal environment for high quality experimentation. The dovetail head mount, magnetic tip chip carrier and in-line optical arrangement make tip positioning and laser alignment a very simple task. The acquisition and analysis software is state of the art and allows detailed analysis of images and spectroscopic data. A nanoindentor option enables surface hardness measurements to be undertaken. The separated and high force nature of the scanning piezos produces very high quality images without effects of tip or sample deterioration. The full enclosure and active anti-vibration table which support the instrument provide an optimal environment for high quality experimentation. The dovetail head mount, magnetic tip chip carrier and in-line optical arrangement make tip positioning and laser alignment a very simple task. The acquisition and analysis software is state of the art and allows detailed analysis of images and spectroscopic data. A nanoindentor option enables surface hardness measurements to be undertaken.

Specification

True non-contact mode results in improved resolution due to reduced tip and specimen damage. Separated X-Y & Z Scanner. No coupling between the x-y plane and the z-scanner completely removes background curvature from the fundamental level, and effectively eliminates the cross-talk and non-linearity problems that are intrinsic to conventional piezoelectric tube based AFM systems. Ultra High Force Z-Scanner. The key innovation that enables True Non-Contact Mode in the XE-Series. The ultra high force z-scanner allows a significantly higher resonance frequency than those of conventional piezoelectric tube scanners. This enables more than 10 times faster scan rates than is possible with a conventional tube type scanner. Hardware Closed-loop Feedback. Hardware, not software, feedback is used to drive all the AFM signals in order to guarantee distortion free imaging. Hardware closed-loop position control allows for the absolute scaling of AFM measurements. 2D Guided Flexure X-Y Scanner. High resolution imaging without background curvature. This single module parallelkinematics x-y scanner has low inertia and minimal runout, providing the best orthogonality, high responsiveness, and axis-independent performance.

Item ID #731.

Last Updated: 16th January, 2014

PSIA XE-100 Atomic Force Microscope

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