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Field Emission Scanning Electron Microscope

MANUFACTURER JEOL
MODEL JSM 6301F

Institute of Archaeology

AVAILABILITY Enquire for details
TRAINING Training is required to use this item.
CONTACT 1 Tom Gregory
CONTACT 2 Ian Freestone
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SITE Bloomsbury Campus

Description

High magnification for nanotechnology applications

Item ID #807.

Last Updated: 20th May, 2015

Field Emission Scanning Electron Microscope

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