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Variable Pressure Scanning Electron Microscope

MANUFACTURER Hitachi
MODEL S3400N

Institute of Archaeology

AVAILABILITY Enquire for details
TRAINING Training is required to use this item.
CONTACT 1 Tom Gregory
CONTACT 2 Ian Freestone
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SITE Bloomsbury Campus

Description

SEM with low vacuum function for imaging and analysis

Upgrades

Oxford Instruments Microanalysis System

Future Upgrades

Item ID #805.

Last Updated: 21st May, 2015

Variable Pressure Scanning Electron Microscope

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