Enquire Now

Focused Ion Beam (FIB) Microscope XB1540

MANUFACTURER Zeiss
MODEL XB1540

London Centre for Nanotechnology

TRAINING No special training required.
CONTACT 1 Dr Suguo Huo
Enquire about this item
SITE Bloomsbury Campus

Description

The instrument is equipped not only with an in situ field-emission scanning electron microscope for gallium-free imaging, but also an in situ low-voltage argon-ion-miller for gallium-free nanofabrication.

Item ID #2389.

Last Updated: 6th November, 2015

Focused Ion Beam (FIB) Microscope XB1540

There are no publically available categories listed at present. You may have to sign in to browse this catalogue.