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|MODEL||Jeol JSM - 6480LV|
|TRAINING||No special training required.|
|CONTACT 1||Jim Davy|
|CONTACT 2||Peter Sammonds|
|Enquire about this item|
Variable Pressure Analytical Scanning Electron Microscope with a high resolution of 3.0nm
Item ID #.
Last Updated: 19th March, 2013