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|RESTRICTIONS||No access without a onhand Phd student to supervise|
|TRAINING||Training is required to use this item and we can arrange this if needed.|
|CALIBRATED||Yes, this item is calibrated.
Last Calibration: 14th March, 2014
Next Calibration: 13th March, 2015
|CONTACT 1||Kenneth Tong|
|CONTACT 2||Paul Brennan|
|Enquire about this item|
The EE Department is fortunate to have a 1 to 40 GHz antenna measurement facility. This is used to measure the radiation pattern of antennas in order to determine their gain, directivity and other key properties. This type of instrument has many applications including radio communications and radar.
The instrument operates using a spherical far-field scanning technique in which measurements are made by scanning antennas over a complete spherical surface. This allows considerable versatility in the measurement of a wide range of antenna types in a small space, and is a facility that is usually only available in industry. Antennas of up to 1 m in length and 20 kg in weight may be measured over a 1 to 40 GHz range. A screened room is used in order to reduce interference from external signals, in which 100 dB of suppression, to 40 GHz, is achieved. The room is lined with absorbing material (RAM) to reduce reflections that would otherwise result in pattern measurement errors.
This unique integrated system can measure antenna radiation patterns with full 3D coverage over a frequency range from 1 to 40 GHz (S, C, X, Ku, K and Ka bands) with an anticipated extension to lower frequencies.
Item ID #.
Last Updated: 17th March, 2014
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