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|MODEL||HSC2 (MT5000HC), HSC2 (H1002), Oxford CT1500|
|TRAINING||No special training required.|
|CONTACT 1||Jim Davy|
|CONTACT 2||Peter Sammonds|
|Enquire about this item|
Allows dynamic tensile, compression and bending tests of specimens in the SEM (Scanning Electron Microscope)*. Allows dynamic observations of phase transitions and other microstructural changes with respect to temperature within the SEM (Scanning Electron Microscope)
Item ID #.
Last Updated: 19th March, 2013